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2012SPIE.8446E..5WE
The impact of surface-polish on the angular and wavelength dependence of fiber focal ratio degradation
Eigenbrot, Arthur D. ( Univ. of Wisconsin-Madison (United States) ); Bershady, Matthew A. ( Univ. of Wisconsin-Madison (United States) ); Wood, Corey M. ( Univ. of Wisconsin-Madison (United States) ) show affiliations
Ground-based and Airborne Instrumentation for Astronomy IV. Proceedings of the SPIE, Volume 8446, article id. 84465W, 10 pp. (2012).
Published in Sep 2012
We present measurements of how multimode fiber focal-ratio degradation (FRD) and throughput vary with levels of fiber surface polish from 60 to 0.5 micron grit. Measurements used full-beam and laser injection methods at wavelengths between 0.4 and 0.8 microns on 17 meter lengths of Polymicro FBP 300 and 400 μm core fiber. Full-beam injection probed input focal-ratios between f/3 and f/13.5, while laser injection allowed us to isolate FRD at discrete injection angles up to 17 degrees (f/1.6 marginal ray). We find (1) FRD effects decrease as grit size decreases, with the largest gains in beam quality occurring at grit sizes above 5 μm (2) total throughput increases as grit size decreases, reaching 90% at 790 nm with the finest polishing levels; (3) total throughput is higher at redder wavelengths for coarser polishing grit, indicating surface-scattering as the primary source of loss. We also quantify the angular dependence of FRD as a function of polishing level. Our results indicate that a commonly adopted micro-bending model for FRD is a poor descriptor of the observed phenomenon.
Keywords:
Free Keywords: Astrophysics - Instrumentation and Methods for Astrophysics
arXiv: Astrophysics - Instrumentation and Methods for Astrophysics
(c) 2012: SPIE. Downloading of the abstract is permitted for personal use only.
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